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Modified CT-ANN model for correlated repeated measurement data

Adhikary, Saikat.

Modified CT-ANN model for correlated repeated measurement data Saikat Adhikary - Kolkata St. Xavier's University 2024 - 15p.

As fulfilment of the requirement for the MSc. in Statistics Degree

Reg No: XK01-1112-0921-22
CIN No: 22-001-05-01-0002

Subjects--Topical Terms:
Statistical Model testing

Dewey Class. No.: 519.5 / ADH(MOD)

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